An Analytical Future for X-ray Absorption Fine Structure

Abstract:
Advanced x-ray spectroscopies, such as x-ray absorption fine structure (XAFS), have unique experimental applications for problems where long range order is absent or where the desired science depends on the element-specific local structure. Examples of such problems are common in electrical energy storage materials, catalysts, and many environmental problems. Despite its broad utility, XAFS has long been viewed as a specialist technique because of the need for synchrotron access and, admittedly, the need for some specialized training for some data analysis. However, for the last 10 years our group at the University of Washington has been leading the effort to broaden access to XAFS and related methods using laboratory based spectrometers. In this talk I'll give a broad background on XAFS, briefly review the technology for modern laboratory XAFS, and then emphasize the new analytical (rather than specialist!) opportunities that have emerged. I'll conclude with a discussion of the future challenge of community training for quality control, and seek to understand the lessons learned from the ongoing reassessment by the x-ray photoelectron spectroscopy community.

Bio:
Jerry Seidler is a Professor in the UW Physics Department and Adjunct Professor of MS&E. He specializes in x-ray spectroscopy instrumentation and its applications across a wide range of problems in energy science and the environmental arena. Jerry is also a cofounder of easyXAFS, LLC, which is commercializing UW technology for laboratory-based XAFS.